Josep Altet
Josep Altet
Verified email at upc.edu
TitleCited byYear
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
772001
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
742006
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
532002
Thermal testing of integrated circuits
J Altet, A Rubio
Springer Science & Business Media, 2013
382013
CMOS differential and absolute thermal sensors
A Syal, V Lee, A Ivanov, J Altet
Journal of Electronic Testing 18 (3), 295-304, 2002
352002
Electrothermal design procedure to observe RF circuit power and linearity characteristics with a homodyne differential temperature sensor
M Onabajo, J Altet, E Aldrete-Vidrio, D Mateo, J Silva-Martinez
IEEE Transactions on Circuits and Systems I: Regular Papers 58 (3), 458-469, 2010
342010
Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements
E Aldrete-Vidrio, D Mateo, J Altet, MA Salhi, S Grauby, S Dilhaire, ...
Measurement Science and Technology 21 (7), 075104, 2010
312010
Defect-oriented non-intrusive RF test using on-chip temperature sensors
L Abdallah, HG Stratigopoulos, S Mir, J Altet
2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013
292013
Diseño de circuitos y sistemas integrados
JAR Sola
Univ. Politèc. de Catalunya, 2003
282003
Differential Temperature Sensors Fully Compatible With a 0.35-m CMOS Process
E Aldrete-Vidrio, D Mateo, J Altet
IEEE Transactions on Components and Packaging Technologies 30 (4), 618-626, 2007
262007
A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits
J Altet, E Aldrete-Vidrio, D Mateo, X Perpiñà, X Jordà, M Vellvehi, J Millán, ...
Measurement Science and Technology 19 (11), 115704, 2008
192008
Differential sensing strategy for dynamic thermal testing of ICs
J Altet, A Rubio
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No. 97TB100125), 434-439, 1997
191997
Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors
J Altet, D Gomez, X Perpinyà, D Mateo, JL González, M Vellvehi, X Jordà
Sensors and Actuators A: Physical 192, 49-57, 2013
182013
Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography
J León, X Perpiñà, J Altet, M Vellvehi, X Jordà
Applied Physics Letters 102 (5), 054103, 2013
182013
Electro-thermal coupling analysis methodology for RF circuits
D Gómez, C Dufis, J Altet, D Mateo, JL González
Microelectronics Journal 43 (9), 633-641, 2012
172012
Structural RFIC device testing through built-in thermal monitoring
J Altet, A Rubio, JL Rosselló, J Segura
IEEE Communications Magazine 41 (9), 98-104, 2003
152003
Hot-spot detection in integrated circuits by substrate heat-flux sensing
X Perpiñà, J Altet, X Jorda, M Vellvehi, J Millan, N Mestres
IEEE electron device letters 29 (10), 1142-1144, 2008
142008
Steady-state sinusoidal thermal characterization at chip level by internal infrared-laser deflection
X Perpiñà, X Jordà, M Vellvehi, J Altet, N Mestres
Journal of Physics D: Applied Physics 41 (15), 155508, 2008
142008
Localisation of devices acting as heat sources in ICs covered entirely by metal layers
J Altet, MA Salhi, S Dilhaire, A Syal, A Ivanov
Electronics Letters 39 (20), 1440-1442, 2003
142003
Localisation of heat sources in electronic circuits by microthermal laser probing
S Dilhaire, E Schaub, W Claeys, J Altet, A Rubio
International journal of thermal sciences 39 (4), 544-549, 2000
142000
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Articles 1–20