| Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage R Germanicus, S Barde, L Dusseau, G Rolland, C Barillot, F Saigné, ... IEEE Transactions on Nuclear Science 49 (6), 2830-2835, 2002 | 36 | 2002 |
| Analysis of the proton-induced permanent degradation in an optocoupler R Germanicus, L Dusseau, F Saigné, S Barde, R Ecoffet, O Mion, ... IEEE Transactions on Nuclear Science 49 (3), 1421-1425, 2002 | 25 | 2002 |
| New approach for the prediction of CCD dark current distribution in a space radiation environment O Gilard, M Boutillier, G Quadri, G Rolland, R Germanicus IEEE Transactions on Nuclear Science 55 (6), 3626-3632, 2008 | 24 | 2008 |
| Impact of electrical stress and neutron irradiation on reliability of silicon carbide power MOSFET K Niskanen, AD Touboul, RC Germanicus, A Michez, A Javanainen, ... IEEE Transactions on Nuclear Science 67 (7), 1365-1373, 2020 | 22 | 2020 |
| Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains RC Germanicus, E Picard, B Domenges, K Danilo, R Rogel Applied surface science 253 (14), 6006-6012, 2007 | 21 | 2007 |
| Hardening of a radiation sensor based on optically stimulated luminescence JR Vaille, S Ducret, K Idri, F Saigné, S Matias, N Iborra, R Germanicus, ... IEEE Transactions on Nuclear Science 50 (6), 2358-2362, 2003 | 21 | 2003 |
| Three dimensional resistance mapping of self-organized Sr3V2O8 nanorods on metallic perovskite SrVO3 matrix RC Germanicus, Y Bourlier, V Notot, B Bérini, V Demange, M Berthe, ... Applied Surface Science 510, 145522, 2020 | 20 | 2020 |
| High-energy particle irradiation of optically stimulated luminescent films at CERN L Dusseau, G Polge, S Mathias, JR Vaille, R Germanicus, R Broadhead, ... Nuclear Science, IEEE Transactions on 48 (6), 2056-2060, 2001 | 19 | 2001 |
| Radiation hardness assurance through system-level testing: Risk acceptance, facility requirements, test methodology, and data exploitation A Coronetti, RG Alía, J Budroweit, T Rajkowski, IDC Lopes, K Niskanen, ... IEEE transactions on nuclear science 68 (5), 958-969, 2021 | 18 | 2021 |
| Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation R Coq Germanicus, D Mercier, F Agrebi, M Febvre, D Mariolle, ... Journal of Microscopy 280 (1), 51-62, 2020 | 15 | 2020 |
| On the effects of a pressure induced amorphous silicon layer on consecutive spreading resistance microscopy scans of doped silicon R Coq Germanicus, P Leclère, Y Guhel, B Boudart, AD Touboul, ... Journal of Applied Physics 117 (24), 2015 | 14 | 2015 |
| Analytic description of scanning capacitance microscopy H Murray, R Germanicus, A Doukkali, P Martin, B Domenges, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2007 | 14 | 2007 |
| Neutron-induced failure dependence on reverse gate voltage for SiC power MOSFETs in atmospheric environment K Niskanen, RC Germanicus, A Michez, F Wrobel, J Boch, F Saigné, ... IEEE Transactions on Nuclear Science 68 (8), 1623-1632, 2021 | 13 | 2021 |
| Proton damage effects on GaAs/GaAlAs vertical cavity surface emitting lasers P Le Metayer, O Gilard, R Germanicus, D Campillo, F Ledu, J Cazes, ... Journal of applied physics 94 (12), 7757-7763, 2003 | 11 | 2003 |
| Broadband characterization of dielectric materials from RF, millimeter-wave to THz frequencies accounting for anisotropy S Massenot, D Bajon, S Wane, L Leyssenne, R Coq-Germanicus, ... 2014 IEEE MTT-S International Microwave Symposium (IMS2014), 1-4, 2014 | 8 | 2014 |
| Electromagnetic modeling and experimental characterization of dielectric material and liquid properties from RF to THz L Leyssenne, S Wane, S Massenot, D Bajon, R Coq-Germanicus, ... 2013 International Conference on Electromagnetics in Advanced Applications …, 2013 | 8 | 2013 |
| Rapid thermal annealing of cerium dioxide thin films sputtered onto silicon (111) substrates: Influence of heating rate on microstructure and electrical properties Y Guhel, T Toloshniak, J Bernard, A Besq, RC Germanicus, J El Fallah, ... Materials Science in Semiconductor Processing 30, 352-360, 2015 | 7 | 2015 |
| Failure analysis of atmospheric neutron-induced single event burnout of a commercial SiC MOSFET RC Germanicus, K Niskanen, A Michez, N Moultif, W Jouha, O Latry, ... Materials Science Forum 1062, 544-548, 2022 | 6 | 2022 |
| Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates M Upadhyay, MB Elbahri, M Mezhoud, RC Germanicus, U Lüders Solid-State Electronics 186, 108070, 2021 | 6 | 2021 |
| Mapping of integrated PIN diodes with a 3D architecture by scanning microwave impedance microscopy and dynamic spectroscopy RC Germanicus, P De Wolf, F Lallemand, C Bunel, S Bardy, H Murray, ... Beilstein Journal of Nanotechnology 11 (1), 1764-1775, 2020 | 6 | 2020 |
