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Donald S. Gardner
Donald S. Gardner
Stanford University / SLAC National Accelerator Laboratory
Dirección de correo verificada de alumni.stanford.edu
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Citado por
Año
Measurement and interpretation of stress in aluminum-based metallization as a function of thermal history
PA Flinn, DS Gardner, WD Nix
IEEE Transactions on electron devices 34 (3), 689-699, 1987
7431987
Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniques
MF Doerner, DS Gardner, WD Nix
Journal of Materials Research 1 (6), 845-851, 1986
4611986
Embedded ground plane and shielding structures using sidewall insulators in high frequency circuits having vias
DS Gardner
US Patent 5,414,221, 1995
4241995
A 233-MHz 80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package
P Hazucha, G Schrom, J Hahn, BA Bloechel, P Hack, GE Dermer, ...
IEEE Journal of Solid-State Circuits 40 (4), 838-845, 2005
4112005
Review of on-chip inductor structures with magnetic films
DS Gardner, G Schrom, F Paillet, B Jamieson, T Karnik, S Borkar
IEEE Transactions on Magnetics 45 (10), 4760-4766, 2009
3782009
Methods of forming an interconnect on a semiconductor substrate
XC Mu, S Sivaram, DS Gardner, DB Fraser
US Patent 5,612,254, 1997
3671997
Method for the anisotropic etching of metal films in the fabrication of interconnects
DS Gardner, XC Mu, DB Fraser
US Patent 5,350,484, 1994
2291994
Mechanical stress as a function of temperature in aluminum films
DS Gardner, PA Flinn
IEEE Transactions on electron devices 35 (12), 2160-2169, 1988
2101988
Integrated on-chip inductors with magnetic films
DS Gardner, G Schrom, P Hazucha, F Paillet, T Karnik, S Borkar, ...
2006 International Electron Devices Meeting, 1-4, 2006
1622006
Method of forming a high surface area interconnection structure
DS Gardner
US Patent 5,817,574, 1998
1621998
A 480-MHz, multi-phase interleaved buck DC-DC converter with hysteretic control
G Schrom, P Hazucha, J Hahn, DS Gardner, BA Bloechel, G Dermer, ...
2004 IEEE 35th annual power electronics specialists conference (IEEE Cat. No …, 2004
1582004
Mechanical stress as a function of temperature for aluminum alloy films
DS Gardner, PA Flinn
Journal of Applied Physics 67 (4), 1831-1844, 1990
1501990
Influence of line dimensions on the resistance of Cu interconnections
DG Fen Chen
Electron Device Letters 19 (12), 508-510, 1998
146*1998
Integrated on-chip inductors using magnetic material
DS Gardner, G Schrom, P Hazucha, F Paillet, T Karnik, S Borkar, ...
Journal of Applied Physics 103 (7), 2008
1392008
QED: Quick error detection tests for effective post-silicon validation
T Hong, Y Li, SB Park, D Mui, D Lin, ZA Kaleq, N Hakim, H Naeimi, ...
2010 IEEE International Test Conference, 1-10, 2010
1272010
Interconnection and electromigration scaling theory
DS Gardner, JD Meindl, KC Saraswat
IEEE Transactions on Electron Devices 34 (3), 633-643, 1987
1221987
A 100MHz eight-phase buck converter delivering 12A in 25mm2 using air-core inductors
G Schrom, P Hazucha, F Paillet, DJ Rennie, ST Moon, DS Gardner, ...
APEC 07-Twenty-Second Annual IEEE Applied Power Electronics Conference and …, 2007
1172007
High-frequency microinductors with amorphous magnetic ground planes
AM Crawford, D Gardner, SX Wang
IEEE transactions on magnetics 38 (5), 3168-3170, 2002
1072002
Design techniques for cross-layer resilience
NP Carter, H Naeimi, DS Gardner
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
982010
Observations of electromigration induced void nucleation and growth in polycrystalline and near‐bamboo passivated Al lines
T Marieb, P Flinn, JC Bravman, D Gardner, M Madden
Journal of applied physics 78 (2), 1026-1032, 1995
951995
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Artículos 1–20