C. H. Joseph
C. H. Joseph
National Research Council of Italy (CNR), Institute for Microelectronics and Microsystems (IMM)
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TítuloCitado porAño
Scanning microwave microscopy technique for nanoscale characterization of magnetic materials
CH Joseph, GM Sardi, SS Tuca, G Gramse, A Lucibello, E Proietti, ...
Journal of Magnetism and Magnetic Materials 420, 62-69, 2016
52016
Scanning Microwave Microscopy for Nanoscale Characterization of Semiconductors: De-embedding reflection contact mode measurements
L Michalas, A Lucibello, G Badino, CH Joseph, E Brinciotti, F Kienberger, ...
Microwave Conference (EuMC), 2015 European, 159-162, 2015
52015
De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy
L Michalas, E Brinciotti, A Lucibello, G Gramse, CH Joseph, F Kienberger, ...
Microelectronic Engineering 159, 64-69, 2016
42016
Transmission microwave spectroscopy for local characterization of dielectric materials
A Lucibello, CH Joseph, E Proietti, GM Sardi, G Capoccia, R Marcelli
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2017
32017
Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration
L Michalas, A Lucibello, CH Joseph, E Brinciotti, F Kienberger, E Proietti, ...
Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International …, 2015
22015
Transmission Microwave Spectroscopy of Dielectric Materials
A Lucibello, E Proietti, GM Sardi, G Capoccia, CH Joseph, R Marcelli
Microwave Characterization of Magnetic Materials Using Scanning Microwave Microscopy Technique
CH Joseph, G Badino, SS Tuca, GM Sardi, F Kienberger, R Marcelli
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Artículos 1–7