| Translation position determination in ptychographic coherent diffraction imaging F Zhang, I Peterson, J Vila-Comamala, A Diaz, F Berenguer, R Bean, ... Optics express 21 (11), 13592-13606, 2013 | 212 | 2013 |
| Zone-doubling technique to produce ultrahigh-resolution x-ray optics K Jefimovs, J Vila-Comamala, T Pilvi, J Raabe, M Ritala, C David Physical review letters 99 (26), 264801, 2007 | 164 | 2007 |
| Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging J Vila-Comamala, A Diaz, M Guizar-Sicairos, A Mantion, CM Kewish, ... Optics express 19 (22), 21333-21344, 2011 | 135 | 2011 |
| Advanced thin film technology for ultrahigh resolution X-ray microscopy J Vila-Comamala, K Jefimovs, J Raabe, T Pilvi, RH Fink, M Senoner, ... Ultramicroscopy 109 (11), 1360-1364, 2009 | 131 | 2009 |
| Ultra-high resolution zone-doubled diffractive X-ray optics for the multi-keV regime J Vila-Comamala, S Gorelick, E Färm, CM Kewish, A Diaz, R Barrett, ... Optics express 19 (1), 175-184, 2011 | 118 | 2011 |
| Nanofocusing of hard X-ray free electron laser pulses using diamond based Fresnel zone plates C David, S Gorelick, S Rutishauser, J Krzywinski, J Vila-Comamala, ... Scientific Reports 1, 57, 2011 | 104 | 2011 |
| Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of PMMA for electroplating S Gorelick, VA Guzenko, J Vila-Comamala, C David Nanotechnology 21 (29), 295303, 2010 | 101 | 2010 |
| Reconstruction of an astigmatic hard X-ray beam and alignment of KB mirrors from ptychographic coherent diffraction data CM Kewish, M Guizar-Sicairos, C Liu, J Qian, B Shi, C Benson, ... Optics Express 18 (22), 23420-23427, 2010 | 97 | 2010 |
| Phase-contrast tomography at the nanoscale using hard x rays M Stampanoni, R Mokso, F Marone, J Vila-Comamala, S Gorelick, P Trtik, ... Physical Review B 81 (14), 140105, 2010 | 97 | 2010 |
| X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films J Keckes, M Bartosik, R Daniel, C Mitterer, G Maier, W Ecker, ... Scripta Materialia 67 (9), 748-751, 2012 | 95 | 2012 |
| High-efficiency Fresnel zone plates for hard X-rays by 100 keV e-beam lithography and electroplating S Gorelick, J Vila-Comamala, VA Guzenko, R Barrett, M Salomé, C David Journal of Synchrotron Radiation 18 (3), 442-446, 2011 | 94 | 2011 |
| Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics CM Kewish, P Thibault, M Dierolf, O Bunk, A Menzel, J Vila-Comamala, ... Ultramicroscopy 110 (4), 325-329, 2010 | 86 | 2010 |
| Three-dimensional characterization of electrodeposited lithium microstructures using synchrotron X-ray phase contrast imaging DS Eastwood, PM Bayley, HJ Chang, OO Taiwo, J Vila-Comamala, ... Chemical communications 51 (2), 266-268, 2015 | 80 | 2015 |
| Zone-doubled Fresnel zone plates for high-resolution hard X-ray full-field transmission microscopy J Vila-Comamala, Y Pan, J Lombardo, WM Harris, WK Chiu, C David, ... Journal of Synchrotron Radiation 19 (5), 705-709, 2012 | 71 | 2012 |
| Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam A Diaz, C Mocuta, J Stangl, B Mandl, C David, J Vila-Comamala, ... Physical Review B 79 (12), 125324, 2009 | 62 | 2009 |
| Role of the illumination spatial-frequency spectrum for ptychography M Guizar-Sicairos, M Holler, A Diaz, J Vila-Comamala, O Bunk, A Menzel Physical Review B 86 (10), 100103, 2012 | 55 | 2012 |
| Phase retrieval by coherent modulation imaging F Zhang, B Chen, GR Morrison, J Vila-Comamala, M Guizar-Sicairos, ... Nature communications 7 (1), 1-8, 2016 | 48 | 2016 |
| Dense high aspect ratio hydrogen silsesquioxane nanostructures by 100 keV electron beam lithography J Vila-Comamala, S Gorelick, VA Guzenko, E Färm, M Ritala, C David Nanotechnology 21 (28), 285305, 2010 | 48 | 2010 |
| Beam-shaping condenser lenses for full-field transmission X-ray microscopy K Jefimovs, J Vila-Comamala, M Stampanoni, B Kaulich, C David Journal of synchrotron radiation 15 (1), 106-108, 2008 | 48 | 2008 |
| Ion beam lithography for Fresnel zone plates in X-ray microscopy K Keskinbora, C Grévent, M Bechtel, M Weigand, E Goering, A Nadzeyka, ... Optics Express 21 (10), 11747-11756, 2013 | 41 | 2013 |
