prof. Andrea Irace

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Giovanni BreglioUniversità di Napoli Federico IIDirección de correo verificada de unina.it
Riccio MicheleUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesDirección de correo verificada de unina.it
Luca MarescaUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesDirección de correo verificada de unina.it
Gianpaolo Romano, PhDSenior R&D Engineer, Hitachi Energy, Semiconductors, SwitzerlandDirección de correo verificada de hitachienergy.com
Vincenzo d'AlessandroAssociate professor of Electronics, DIETI, University Federico II, Naples, ItalyDirección de correo verificada de unina.it
Mario IodiceISASI - CNRDirección de correo verificada de cnr.it
Giuseppe CoppolaInstitute of Applied Science and Intelligent SystemsDirección de correo verificada de cnr.it
Giuseppe De FalcoPh.D., University of Naples "Federico II"- DIETIDirección de correo verificada de unina.it
P.M. (Lina) SarroDelft University of Technology, The NetherlandsDirección de correo verificada de tudelft.nl
Daliento SantoloProfessore di Dispositivi e Sistemi Fotovoltaici, Università di NapoliDirección de correo verificada de unina.it
ettore napoliUniversity of SalernoDirección de correo verificada de unina.it
michele giordanoResearcher Institute Polymers Composites and Biomaterials CNRDirección de correo verificada de cnr.it
Lorenzo CodecasaProfessor of Electric Engineering, Politecnico di MilanoDirección de correo verificada de polimi.it
Alessandro MagnaniSemiZabalaDirección de correo verificada de semizabala.com
Nicholas WrightProfessor of Electronic Materials, Newcastle UniversityDirección de correo verificada de ncl.ac.uk
Paolo MironeUniversity of Naples "Federico II"Dirección de correo verificada de unina.it
Antonio Pio CatalanoAssistant Professor in Electronic Engineering for University of Naples Federico IIDirección de correo verificada de unina.it
Salvatore StranoRicercatore, Dipartimento di Ingegneria Industriale, Università degli Studi di Napoli Federico IIDirección de correo verificada de unina.it
Helmut KöckInfineon TechnologiesDirección de correo verificada de infineon.com
Elina IervolinoDelft university of technologyDirección de correo verificada de tudelft.nl

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prof. Andrea Irace

University of Naples Federico II

Dirección de correo verificada de unina.it

SiC power semiconductor devices optoelectronic devices Wide Bandgap Materials Wide Bandgap Devices


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETs G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 4 (3), 978-987, 2016	238	2016
SiC power MOSFETs performance, robustness and technology maturity A Castellazzi, A Fayyaz, G Romano, L Yang, M Riccio, A Irace Microelectronics Reliability 58, 164-176, 2016	128	2016
All-silicon optical temperature sensor based on Multi-Mode Interference A Irace, G Breglio Optics express 11 (22), 2807-2812, 2003	108	2003
An electrically controlled Bragg reflector integrated in a rib silicon on insulator waveguide A Cutolo, M Iodice, A Irace, P Spirito, L Zeni Applied physics letters 71 (2), 199-201, 1997	102	1997
Short-circuit failure mechanism of SiC power MOSFETs G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ... 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015	94	2015
Short-circuit robustness of SiC power MOSFETs: Experimental analysis A Castellazzi, A Fayyaz, L Yang, M Riccio, A Irace 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	79	2014
Circuit-based electrothermal simulation of power devices by an ultrafast nonlinear MOR approach L Codecasa, V d’Alessandro, A Magnani, A Irace IEEE Transactions on Power Electronics 31 (8), 5906-5916, 2015	75	2015
Experimental detection and numerical validation of different failure mechanisms in IGBTs during unclamped inductive switching G Breglio, A Irace, E Napoli, M Riccio, P Spirito IEEE Transactions on Electron Devices 60 (2), 563-570, 2012	74	2012
Measurement of thermal conductivity and diffusivity of single and multilayer membranes A Irace, PM Sarro Sensors and Actuators A: Physical 76 (1-3), 323-328, 1999	68	1999
A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace IEEE Transactions on power electronics 33 (9), 8020-8029, 2017	66	2017
Experimental analysis of electro-thermal instability in SiC Power MOSFETs M Riccio, A Castellazzi, G De Falco, A Irace Microelectronics Reliability 53 (9-11), 1739-1744, 2013	66	2013
Fiber optic humidity sensors for high-energy physics applications at CERN M Consales, A Buosciolo, A Cutolo, G Breglio, A Irace, S Buontempo, ... Sensors and Actuators B: Chemical 159 (1), 66-74, 2011	64	2011
All-silicon optoelectronic modulator with 1 GHz switching capability A Irace, G Breglio, A Cutolo Electronics Letters 39 (2), 1, 2003	58	2003
UIS failure mechanism of SiC power MOSFETs A Fayyaz, A Castellazzi, G Romano, M Riccio, A Irace, J Urresti, N Wright 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2016	55	2016
SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs V d'Alessandro, A Magnani, M Riccio, G Breglio, A Irace, N Rinaldi, ... 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	51	2014
A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs A Fayyaz, G Romano, J Urresti, M Riccio, A Castellazzi, A Irace, N Wright Energies 10 (4), 452, 2017	45	2017
Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs A Fayyaz, L Yang, M Riccio, A Castellazzi, A Irace Microelectronics Reliability 54 (9-10), 2185-2190, 2014	44	2014
Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019	43	2019
Optical measurement techniques of recombination lifetime based on the free carriers absorption effect M De Laurentis, A Irace Journal of solid state physics 2014, 2014	42	2014
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations M Riccio, A Irace, G Breglio, P Spirito, E Napoli, Y Mizuno 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011	42	2011

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