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Walter Slusark
Walter Slusark
Retired
Dirección de correo verificada de ieee.org
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A 4-GHz GaAs FET power amplifier: An advanced transmitter for satellite down-link communication systems
H Huang
MCBA 41, 472, 1980
231980
The effect of operating conditions on the radiation resistance of VDMOS power FETs
SS Seehra, WJ Slusark
IEEE Transactions on Nuclear Science 29 (6), 1559-1563, 1982
161982
Hard transparent dielectric coatings
W Slusark Jr, B Lalevic, G Taylor
Thin Solid Films 39, 155-163, 1976
121976
Structure and electrical conductivity of cosputtered gold‐chromium alloy films
W Slusark Jr, B Lalevic, N Fuschillo
Journal of Applied Physics 44 (6), 2891-2892, 1973
121973
Switching in Nb—Nb 2 O 6—Nb devices with doped Nb 2 O 5 amorphous films
B Lalevic, N Fuschillo, W Slusark
IEEE Transactions on Electron Devices 22 (10), 965-967, 1975
81975
Space certification and qualification programs for laser diode modules on the NASA ICESat-2 Mission
NW Sawruk, MA Stephen, K Bruce, TF Eltringham, FR Nash, AB Piccirilli, ...
Lidar Remote Sensing for Environmental Monitoring XIV 8872, 7-16, 2013
72013
Switching phenomena and dielectric breakdown in amorphous Nb2O5 films
N Fuschillo, B Lalevic, NK Annamalai, W Slusark Jr
Journal of Non-Crystalline Solids 22 (1), 159-172, 1976
71976
Properties of metal-dielectric codeposited films
G Taylor, B Lalevic, W Slusark Jr
Thin Solid Films 39, 165-174, 1976
61976
Optical properties of thin Au− Cr films and their application to solar energy conversion
N Fuschillo, B Lalevic, W Slusark, A Delahoy
Journal of Vacuum Science and Technology 12 (1), 84-87, 1975
61975
Catastrophic burn out in power VDMOS field-effect transistors
WJ Slusark, RJ Laurie, GL Schnable, J Neilson, E Finn
21st International Reliability Physics Symposium, 173-177, 1983
51983
Switching processes and dielectric breakdown in polycrystalline Nb2O5 films
B Lalevic, W Slusark
Journal of Electronic Materials 5, 531-551, 1976
51976
Reliability of Aluminum-Gate Metallization in GaAs Power FETs
WJ Slusark, GL Schnable, VR Monshaw, M Fukuta
21st International Reliability Physics Symposium, 211-217, 1983
41983
Reliability considerations for communications satellites
VJ Mancino, VR Monshaw, WJ Slusark
1986 Annual Reliability and Maintainability Symposium, Las Vegas, NV, 389-396, 1986
31986
2.12 Dielectric dispersion and polarization effects in thin transition metal oxide films
B Lalevic, N Annamalai, B Leung, G Taylor, W Slusark Jr
Vacuum 27 (4), 249-253, 1977
31977
Optical, mechanical and corrosion properties of metal-metal and metal-dielectric thin layered films
B Lalevic, G Taylor, W Slusark Jr
Thin Solid Films 39, 143-154, 1976
31976
Reliability in communications satellites
VJ Mancino, WJ SLUSARK JR
RCA review 45 (2), 303-325, 1984
21984
Optical properties of cosputtered gold‐chromium alloy films
W Slusark Jr, B Lalevic, M Ausloos
Journal of Applied Physics 48 (1), 248-255, 1977
21977
An 8.5 watt solid-state space-qualified amplifier for satellite communications
B Dornan, W Slusark Jr, YS Wu, P Pelka, R Barton, H Wolkstein, H Huang, ...
NTC 1980; National Telecommunications Conference, Volume 2 2, 44.6. 1-44.6. 6, 1980
11980
Reliability in communications satellites
VJ Mancino, WJ Slusark
Quality and Reliability Engineering International 1 (3), 147-159, 1985
1985
DIELECTRIC DISPERSION, TRANSPORT, AND SWITCHING PROPERTIES OF THIN FILM NIOBIUM-NIOBIUM-PENTOXIDE-NIOBIUM DEVICES.
WJJ SLUSARK
1977
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Artículos 1–20