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P.L. Bonanno
P.L. Bonanno
Yole Group
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Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films
S Park, Y Horibe, T Asada, LS Wielunski, N Lee, PL Bonanno, ...
Nano letters 8 (2), 720-724, 2008
562008
Structural and optical properties of nanodots, nanowires, and multi-quantum wells of III-nitride grown by MOVPE nano-selective area growth
WH Goh, G Patriarche, PL Bonanno, S Gautier, T Moudakir, M Abid, ...
Journal of Crystal Growth 315 (1), 160-163, 2011
432011
Nanoscale selective area growth of thick, dense, uniform, In-rich, InGaN nanostructure arrays on GaN/sapphire template
S Sundaram, R Puybaret, Y El Gmili, X Li, PL Bonanno, K Pantzas, ...
Journal of Applied Physics 116 (16), 2014
252014
High-resolution dislocation imaging and micro-structural analysis of HVPE-βGa2O3 films using monochromatic synchrotron topography
NA Mahadik, MJ Tadjer, PL Bonanno, KD Hobart, RE Stahlbush, ...
APL Materials 7 (2), 2019
232019
Nanoselective area growth and characterization of dislocation-free InGaN nanopyramids on AlN buffered Si (111) templates
S Sundaram, Y El Gmili, R Puybaret, X Li, PL Bonanno, K Pantzas, ...
Applied Physics Letters 107 (11), 2015
202015
High performance TiN gate contact on AlGaN/GaN transistor using a mechanically strain induced P-doping
A Soltani, M Rousseau, JC Gerbedoen, M Mattalah, PL Bonanno, A Telia, ...
Applied Physics Letters 104 (23), 2014
202014
Intrafacet migration effects in InGaN∕ GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction
PL Bonanno, SM O’Malley, AA Sirenko, A Kazimirov, ZH Cai, T Wunderer, ...
Applied Physics Letters 92 (12), 2008
172008
Epitaxial checkerboard arrangement of nanorods in films studied by x-ray diffraction
SM O’Malley, PL Bonanno, KH Ahn, AA Sirenko, A Kazimirov, M Tanimura, ...
Physical Review B 78 (16), 165424, 2008
82008
Evolution of lattice distortions in 4H-SiC wafers with varying doping
NA Mahadik, H Das, S Stoupin, RE Stahlbush, PL Bonanno, X Xu, ...
Scientific Reports 10 (1), 10845, 2020
72020
Submicron beam X-ray diffraction of nanoheteroepitaxily grown GaN: Experimental challenges and calibration procedures
PL Bonanno, S Gautier, AA Sirenko, A Kazimirov, ZH Cai, WH Goh, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2010
72010
APL Mater. 7, 022513 (2019)
NA Mahadik, MJ Tadjer, PL Bonanno, KD Hobart, RE Stahlbush, ...
6
Defects in 4H-SiC epilayers affecting device yield and reliability
R Stahlbush, N Mahadik, P Bonanno, J Soto, B Odekirk, W Sung, ...
2022 IEEE International Reliability Physics Symposium (IRPS), P65-1-P65-6, 2022
52022
Single-crystal nanopyramidal BGaN by nanoselective area growth on AlN/Si (111) and GaN templates
S Sundaram, X Li, Y El Gmili, PL Bonanno, R Puybaret, C Pradalier, ...
Nanotechnology 27 (11), 115602, 2016
52016
Mask effect in nano-selective-area-growth by MOCVD on thickness enhancement, indium incorporation, and emission of InGaN nanostructures on AlN-buffered Si (111) substrates
Y El Gmili, PL Bonanno, S Sundaram, X Li, R Puybaret, G Patriarche, ...
Optical Materials Express 7 (2), 376-385, 2017
32017
Nondestructive mapping of chemical composition and structural qualities of group III-nitride nanowires using submicron beam synchrotron-based X-ray diffraction
PL Bonanno, S Gautier, YE Gmili, T Moudakir, AA Sirenko, A Kazimirov, ...
Thin solid films 541, 46-50, 2013
32013
Evaluating Compositional Variation in InGaAs Random Alloys Using Atom Probe Tomography
NA Kotulak, ME Twigg, NA Mahadik, S Tomasulo, PL Bonanno, ...
Microscopy and Microanalysis 24 (S1), 398-399, 2018
22018
X‐ray diffraction studies of selective area grown InGaN/GaN multiple quantum wells on multi‐facet GaN ridges
SM O'Malley, PL Bonanno, T Wunderer, P Brückner, B Neubert, F Scholz, ...
physica status solidi c 5 (6), 1655-1658, 2008
22008
Selective growth of GaN Nanostructures on SiC by MOVPE and their strain relaxation study by submicron beam x-ray diffraction
WH Goh, PL Bonanno, J Martin, S Gautier, N Maloufi, AA Sirenko, ...
EW MOVPE 2009, 1-1, 2009
12009
High-resolution dislocation imaging and micro-structural analysis of HVPE-Ga
NA Mahadik, MJ Tadjer, PL Bonanno
2018
Nano-selective-area growth of group III-nitrides on silicon and conventional substrates
PL Bonanno
Georgia Institute of Technology, 2016
2016
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Artículos 1–20