| High-performance lithium battery anodes using silicon nanowires CK Chan, H Peng, G Liu, K McIlwrath, XF Zhang, RA Huggins, Y Cui Nature nanotechnology 3 (1), 31-35, 2008 | 7719 | 2008 |
| Pt–Cu Core–Shell and Alloy Nanoparticles for Heterogeneous NOx Reduction: Anomalous Stability and Reactivity of a Core–Shell Nanostructure S Zhou, B Varughese, B Eichhorn, G Jackson, K McIlwrath Angewandte Chemie 117 (29), 4615-4619, 2005 | 345 | 2005 |
| Enhanced CO tolerance for hydrogen activation in Au− Pt dendritic heteroaggregate nanostructures S Zhou, K McIlwrath, G Jackson, B Eichhorn Journal of the American Chemical Society 128 (6), 1780-1781, 2006 | 259 | 2006 |
| Synthesis and characterization of phase-change nanowires S Meister, H Peng, K McIlwrath, K Jarausch, XF Zhang, Y Cui Nano letters 6 (7), 1514-1517, 2006 | 166 | 2006 |
| Ordered Vacancy Compounds and Nanotube Formation in CuInSe2−CdS Core−Shell Nanowires H Peng, C Xie, DT Schoen, K McIlwrath, XF Zhang, Y Cui Nano Letters 7 (12), 3734-3738, 2007 | 88 | 2007 |
| Aberration corrected electron microscopy study of bimetallic Pd–Pt nanocrystal: Core–shell cubic and core–frame concave structures N Lu, J Wang, S Xie, J Brink, K McIlwrath, Y Xia, MJ Kim The Journal of Physical Chemistry C 118 (49), 28876-28882, 2014 | 30 | 2014 |
| Investigation of the chemical composition of the thermally grown oxide layer in thermal barrier systems with NiCoCrAlY bond coats C Mercer, S Faulhaber, N Yao, K McIlwrath, O Fabrichnaya Surface and Coatings Technology 201 (3-4), 1495-1502, 2006 | 30 | 2006 |
| Growth of straight silicon nanowires on amorphous substrates with uniform diameter, length, orientation, and location using nanopatterned host-mediated catalyst C Wang, PF Murphy, N Yao, K McIlwrath, SY Chou Nano letters 11 (12), 5247-5251, 2011 | 20 | 2011 |
| Bottom-up sample preparation technique for interfacial characterization of vertically aligned carbon nanofibers Y Ominami, Q Ngo, NP Kobayashi, K Mcilwrath, K Jarausch, AM Cassell, ... Ultramicroscopy 106 (7), 597-602, 2006 | 10 | 2006 |
| Use of STEM in nanometer level defect analysis of SRAM devices N Wang, S Daniel, D Becker, K Mcilwrath INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 313-318, 2001 | 3 | 2001 |
| Automated 3D EDS acquisition for spatially resolved elemental characterization of catalyzed MgH2 nanostructures B Van Devener, K McIlwrath, S Kim, ZZ Fang, C Zhou Microscopy and Microanalysis 22 (S3), 276-277, 2016 | 2 | 2016 |
| Imaging and elemental mapping of biological specimens with the Hitachi HD-2300A dual-EDS scanning transmission electron microscope JS Wu, AM Kim, RG Marvin, BD Myers, TK Woodruff, TV O'Halloran, ... Microscopy and Microanalysis 16 (S2), 884-885, 2010 | 1 | 2010 |
| Performance Characterization of Hitachi HD-2300A STEM with Dual-EDS Configuration BD Myers, K McIlwrath, J Wu, S Li, H Inada, VP Dravid Microscopy and Microanalysis 16 (S2), 942-943, 2010 | 1 | 2010 |
| An investigation of Au-Ag interface formed by cold welding using focused ion beam/transmission electron microscopy Y Cao, N Yao, K McIlwrath, J Zhou, G Osinkolu, WO Soboyejo MRS Online Proceedings Library (OPL) 965, 0965-S12-06, 2006 | 1 | 2006 |
| Post-FIB Cleaning of TEM Specimens from 14 nm and Other FinFETs by Concentrated Argon Ion Milling C Bonifacio, M Campin, K McIlwrath, P Fischione EDFA Technical Articles 21 (4), 4-12, 2019 | | 2019 |
| Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits CS Bonifacio, M Campin, K McIlwrath, M Ray, PE Fischione Microscopy and Microanalysis 24 (S1), 150-151, 2018 | | 2018 |
| Automated 3D STEM-EDS for Spatially Resolved Elemental Characterization of Semiconductors K McIlwrath, H Furukawa, N Horii, K Nakano ISTFA 2016, 468-471, 2016 | | 2016 |
| Aberration-Corrected STEM and Tomography of Pd-Pt Nanoparticles: Core-Shell Cubic and Core-Frame Concave Structures N Lu, J Wang, S Xie, J Brink, K McIlwrath, Y Xia, MJ Kim Microscopy and Microanalysis 21 (S3), 1731-1732, 2015 | | 2015 |
| In Situ Electron Microscopy Study of Current-Induced Failure of Carbon Nanofibers M Suzuki, Y Ominami, Q Ngo, CY Yang, K Mcilwrath, K Jarausch, ... ISTFA 2006, 521-524, 2006 | | 2006 |
| Interface Characterization for Vertically Aligned Carbon Nanofibers for On-chip Interconnect Applications Y Ominami, Q Ngo, M Suzuki, K Mcilwrath, K Jarausch, AM Cassell, J Li, ... 2006 13th International Symposium on the Physical and Failure Analysis of …, 2006 | | 2006 |
