Martin Kreuzer
Martin Kreuzer
ALBA - the Spanish Synchrotron Light Source
Verified email at cells.es - Homepage
Title
Cited by
Cited by
Year
BioRef: A versatile time-of-flight reflectometer for soft matter applications at Helmholtz–Zentrum Berlin
M Strobl, R Steitz, M Kreuzer, M Rose, H Herrlich, F Mezei, M Grunze, ...
Review of Scientific Instruments 82 (5), 055101, 2011
412011
BioRef: A versatile time-of-flight reflectometer for soft matter applications at Helmholtz–Zentrum Berlin
M Strobl, R Steitz, M Kreuzer, M Rose, H Herrlich, F Mezei, M Grunze, ...
Review of Scientific Instruments 82 (5), 055101, 2011
412011
Fine-Tuning the Structure of Stimuli-Responsive Polymer Films by Hydrostatic Pressure and Temperature
M Reinhardt, J Dzubiella, M Trapp, P Gutfreund, M Kreuzer, ...
Macromolecules 46 (16), 6541-6547, 2013
352013
Impact of a model synovial fluid on supported lipid membranes
M Kreuzer, M Strobl, M Reinhardt, MC Hemmer, T Hauß, R Dahint, ...
Biochimica et Biophysica Acta (BBA)-Biomembranes 1818 (11), 2648-2659, 2012
292012
Optical and mechanical properties of nanofibrillated cellulose: Toward a robust platform for next-generation green technologies
CD Simão, JS Reparaz, MR Wagner, B Graczykowski, M Kreuzer, ...
Carbohydrate Polymers 126, 40-46, 2015
242015
Pressure cell for investigations of solid–liquid interfaces by neutron reflectivity
M Kreuzer, T Kaltofen, R Steitz, BH Zehnder, R Dahint
Review of Scientific Instruments 82 (2), 023902, 2011
182011
BioRef–a time-of-flight neutron reflectometer combined with in-situ infrared spectroscopy at the Helmholtz Centre Berlin
Z Izaola, M Russina
Journal of Physics: Conference Series 251, 012059, 2010
162010
MIRAS: The Infrared Synchrotron Radiation Beamline at ALBA
I Yousef, L Ribó, A Crisol, I Šics, G Ellis, T Ducic, M Kreuzer, ...
Synchrotron Radiation News 30 (4), 4-6, 2017
152017
In-line metrology for roll-to-roll UV assisted nanoimprint lithography using diffractometry
M Kreuzer, GL Whitworth, A Francone, J Gomis-Bresco, N Kehagias, ...
APL Materials 6 (5), 058502, 2018
82018
BioRef II—Neutron reflectometry with relaxed resolution for fast, kinetic measurements at HZB
M Trapp, R Steitz, M Kreuzer, M Strobl, M Rose, R Dahint
Review of Scientific Instruments 87 (10), 105112, 2016
52016
Poly-acrylic Acid Brushes and Adsorbed Proteins
M Reinhardt, M Kreuzer, T Geue, R Dahint, M Ballauff, R Steitz
Zeitschrift für Physikalische Chemie 229 (7), 1119-1139, 2015
52015
Solid-supported lipid membranes and their response to varied environmental conditions
M Kreuzer
52012
Polymer-Induced Swelling of Solid-Supported Lipid Membranes
M Kreuzer, M Trapp, R Dahint, R Steitz
Membranes - Special Issue Membrane Structure and Dynamics, 2015
42015
Formation of Titanium Nanostructures on Block Copolymer Templates with Varying Molecular Weights
M Kreuzer, C Simão, A Diaz, CM Sotomayor Torres
Macromolecules 47 (24), 8691-8699, 2014
42014
Selective Self Assembly of Glutamate Molecules on Polyelectrolyte Multilayers
N Paul, A Paul, R Steitz, M Kreuzer, MC Lux-Steiner
The Journal of Physical Chemistry B 116 (15), 4492-4499, 2012
32012
Nanoscale mapping of thermal and mechanical properties of bare and metal-covered self-assembled block copolymer thin films
A El Sachat, J Spièce, C Evangeli, AJ Robson, M Kreuzer, ...
ACS Applied Polymer Materials 2 (2), 487-496, 2019
22019
Lipid loses and barrier function modifications of the brown‐to‐white hair transition
MA Oliver, M Marti, L Coderch, V Carrer, M Kreuzer, C Barba
Skin Research and Technology 25 (4), 517-525, 2019
22019
Synchrotron-based infrared microspectroscopy study on the radiosensitization effects of Gd nanoparticles at megavoltage radiation energies
I Martínez-Rovira, O Seksek, J Puxeu, J Gómez, M Kreuzer, T Dučić, ...
Analyst 144 (18), 5511-5520, 2019
22019
In-line metrology setup for periodic nanostructures based on sub-wavelength diffraction
M Kreuzer, JG Bresco, M Sledzinska, CMS Torres
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V …, 2015
22015
A diffractometer for quality control in nano fabrication processing based on subwavelength diffraction
M Kreuzer, JG Bresco, M Sledzinska, CMS Torres
Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015
22015
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Articles 1–20