| Oxygen Vacancy Creation, Drift, and Aggregation in TiO2‐Based Resistive Switches at Low Temperature and Voltage J Kwon, AA Sharma, JA Bain, YN Picard, M Skowronski Advanced Functional Materials 25 (19), 2876-2883, 2015 | 96 | 2015 |
| Characterization of deformation anisotropies in an α-Ti alloy by nanoindentation and electron microscopy J Kwon, MC Brandes, PS Phani, AP Pilchak, YF Gao, EP George, ... Acta Materialia 61 (13), 4743-4756, 2013 | 82 | 2013 |
| Transient thermometry and high-resolution transmission electron microscopy analysis of filamentary resistive switches J Kwon, AA Sharma, CY Chen, A Fantini, M Jurczak, AA Herzing, JA Bain, ... ACS Applied Materials & Interfaces 8 (31), 20176-20184, 2016 | 40 | 2016 |
| Dynamics of electroforming in binary metal oxide-based resistive switching memory AA Sharma, IV Karpov, R Kotlyar, J Kwon, M Skowronski, JA Bain Journal of Applied Physics 118 (11), 2015 | 35 | 2015 |
| Characterization of dislocation structures and deformation mechanisms in as-grown and deformed directionally solidified NiAl–Mo composites J Kwon, ML Bowers, MC Brandes, V McCreary, IM Robertson, PS Phani, ... Acta Materialia 89, 315-326, 2015 | 25 | 2015 |
| In situ biasing TEM investigation of resistive switching events in TiO2-based RRAM J Kwon, YN Picard, M Skowronski, AA Sharma, JA Bain 2014 IEEE International Reliability Physics Symposium, 5E. 5.1-5E. 5.5, 2014 | 6 | 2014 |
| In Situ Biasing TEM Characterization of Resistive Switching Phenomena in TiO2-based RRAM J Kwon, AA Sharma, JA Bain, YN Picard, M Skowronski Microscopy and Microanalysis 20 (S3), 1548-1549, 2014 | 2 | 2014 |
| Efficient cooling method for a cu coil in an induction cooker by using an insulation sheet JH Kwon, YJ Nam, KH Shin, SH Lim Journal of Magnetics 16 (1), 31-35, 2011 | 2 | 2011 |
| Transient thermometry and HRTEM analysis of RRAM thermal dynamics during switching and failure J Kwon, AA Sharma, CY Chen, A Fantini, M Jurczak, JA Bain, YN Picard, ... 2016 IEEE International Reliability Physics Symposium (IRPS), 7B-3-1-7B-3-5, 2016 | 1 | 2016 |
| Read disturb and device failure studies in TiO2-based resistive switches J Kwon, AA Sharma, JA Bain, YN Picard, M Skowronski 2015 73rd Annual Device Research Conference (DRC), 291-292, 2015 | | 2015 |
| Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns ML Bowers, PJ Phillips, J Kwon, MC Brandes, MJ Mills, M De Graef Microscopy and Microanalysis 20 (S3), 114-115, 2014 | | 2014 |
| Zone axis STEM defect imaging based on electron Kossel patterns P Phillips, J Kwon, M Brandes, M Mills, M De Graef Microscopy and Microanalysis 18 (S2), 710-711, 2012 | | 2012 |
| Characterization of deformation mechanisms in pre-strained NiAl-Mo composites and α-Ti alloy J Kwon The Ohio State University, 2012 | | 2012 |
| Analysis of Dislocation Structures Underneath Nanoindents in an alpha-Ti Alloy J Kwon, PS Phani, MC Brandes, A Pilchak, EP George, GM Pharr, ... AIP Conference Proceedings, 2012 | | 2012 |
| Examining Dislocation Structures in Mo Pre-Strained Fibers via Electron Tomography V McCreary, G Liu, J Kwon, K Johanns, PS Phani, I Robertson, M Mills, ... Microscopy and Microanalysis 17 (S2), 1006-1007, 2011 | | 2011 |
| M&M Student Awards D Bolser, WJ Bowman, MJ Burch, MD Hecht, C Hong, U Huh, D Jha, ... | | |
