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Óscar González Ossorio
Óscar González Ossorio
Universidad de Valladolid - Departamento de Electricidad y Electrónica
Verified email at alumnos.uva.es
Title
Cited by
Cited by
Year
Programming Pulse Width Assessment for Reliable and Low-Energy Endurance Performance in Al:HfO2-Based RRAM Arrays
E Pérez, Ó González Ossorio, S Dueñas, H Castán, H García, C Wenger
Electronics 9 (5), 864, 2020
332020
Semiempirical Memdiode Model for Resistive Switching Devices in Dynamic Regimes
C Santa Cruz González, B Sahelices Fernández, J Jiménez, ...
Institute of Electrical and Electronics Engineers, 2021
2021
Caracterización eléctrica de dispositivos de conmutación resistiva para su aplicación en el ámbito de memorias no volátiles y de circuitos neuromórficos
Ó González Ossorio
2021
Current and Voltage Control of Intermediate States in Bipolar Rram Devices for Neuristor Applications
H García García, Ó González Ossorio, S Dueñas Carazo, ...
IOP Publishing, 2020
2020
Double swing quiescent-current: An experimental detection method of ferroelectricity in very leaky dielectric films
S Dueñas Carazo, MH Castán Lanaspa, Ó González Ossorio, ...
IOP Publishing, 2020
2020
Current pulses to control the conductance in RRAM devices
H García García, S Dueñas Carazo, Ó González Ossorio, ...
IEEE Xplore, 2020
2020
Single and complex devices on three topological configurations of HfO2 based RRAM
Ó González Ossorio, S Poblador Cester, G Vinuesa Sanz, ...
IEEE Xplore, 2020
2020
Effective reduction of the programing pulse width in Al: HfO2-based RRAM arrays
Ó González Ossorio, E Pérez, S Dueñas Carazo, MH Castán Lanaspa, ...
IEEE Xplore, 2019
2019
Controlling the intermediate conductance states in RRAM devices for synaptic applications
H García García, Ó González Ossorio, S Dueñas Carazo, ...
Elsevier, 2019
2019
Dynamics of set and reset processes on resistive switching memories
S Dueñas Carazo, MH Castán Lanaspa, Ó González Ossorio, ...
Elsevier, 2019
2019
The role of defects in the resistive switching behavior of Ta2O5-TiO2-based metal–insulator–metal (MIM) devices for memory applications
S Dueñas Carazo, MH Castán Lanaspa, H García García, ...
Springer Link, 2018
2018
Resistive switching properties of atomic layer deposited ZrO2-HfO2 thin films
Ó González Ossorio, S Dueñas Carazo, MH Castán Lanaspa, A Tamm, ...
IEEE Xplore, 2018
2018
Admittance memory cycles of Ta2O5-ZrO2-based RRAM devices
S Dueñas Carazo, MH Castán Lanaspa, Ó González Ossorio, ...
Institute of Electrical and Electronics Engineers, 2018
2018
Analysis and control of the intermediate memory states of RRAM devices by means of admittance parameters
MH Castán Lanaspa, S Dueñas Carazo, H García García, ...
AIP Publishing, 2018
2018
Adquisición y análisis de datos de dispositivos de memoria de conmutación resistiva
Ó González Ossorio
2017
Desarrollo de una interfaz con orientación al objeto para Hitmap
Ó González Ossorio
2015
Interfaz orientado al objeto para una biblioteca de programación paralela
O Gonzalez-Ossorio, J Fresno, A Gonzalez-Escribano
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Articles 1–17