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M Bierzychudek
M Bierzychudek
INTI
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Title
Cited by
Cited by
Year
Precision high-value resistance scaling with a two-terminal cryogenic current comparator
FL Hernandez-Marquez, ME Bierzychudek, GR Jones, RE Elmquist
Review of Scientific Instruments 85 (4), 2014
222014
Uncertainty evaluation in a two-terminal cryogenic current comparator
ME Bierzychudek, RE Elmquist
IEEE Transactions on Instrumentation and Measurement 58 (4), 1170-1175, 2008
142008
A project-based learning method applied to an introductory course in electronics engineering
P Etchepareborda, ME Bierzychudek, L Carducci, FE Veiras, ...
2018 IEEE World Engineering Education Conference (EDUNINE), 1-4, 2018
92018
Robust control of a two-terminal cryogenic current comparator
ME Bierzychudek, RS Sánchez–Peña, A Tonina
IEEE transactions on Instrumentation and Measurement 62 (6), 1736-1742, 2013
92013
Application of robust control to a cryogenic current comparator
ME Bierzychudek, M Götz, RS Sánchez-Peña, R Iuzzolino, D Drung
IEEE Transactions on Instrumentation and Measurement 66 (6), 1095-1102, 2017
62017
High resistance scaling from 10 kΩ and QHR standards using a cryogenic current comparator
R Elmquist, GR Jones, B Pritchard, M Bierzychudek, F Hernandez
2008 Conference on Precision Electromagnetic Measurements Digest, 268-269, 2008
62008
Identification and control of a cryogenic current comparator using robust control theory
ME Bierzychudek, RS Sánchez-Peña, A Tonina
IEEE Transactions on Instrumentation and Measurement 64 (12), 3451-3457, 2015
52015
Calibration of weld current monitors at INTI Argentina
JL Casais, ME Bierzychudek, B Djokic, H Parks
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
42020
Design and Simulation of a High-Order Sigma-Delta Continuous-Time Modulator
R Iuzzolino, ME Bierzychudek, A Belcher, R Dekker, J Herick, J Williams, ...
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 1-2, 2018
42018
Towards a Metrology class ADC based on Josephson junction devices
A Belcher, J Williams, J Ireland, R Iuzzolino, ME Bierzychudek, R Dekker, ...
Journal of Physics: Conference Series 1065 (5), 052044, 2018
32018
On the development of an ac-quantum voltmeter
R Iuzzolino, ME Bierzychudek, L Palafox, R Behr, A Tedesco
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 1-2, 2018
22018
Towards a quantum sampling system
R Iuzzolino, R Behr, M Bierzychudek, L Palafox
2016 Conference on Precision Electromagnetic Measurements (CPEM 2016), 1-2, 2016
22016
Bilateral Comparison of 1.018 V and 10 V Standards between the INTI (Argentina) and the BIPM, August to October 2009 (part of the ongoing BIPM key comparison BIPM. EM-K11. a and b)
A Tonina, R Iuzzolino, M Bierzychudek, M Real, S Solve, R Chayramy, ...
Metrologia 47 (1A), 01002-01002, 2010
22010
Design and fabrication of high value standard resistors at INTI
M Bierzychudek, R Garcia, M Real, A Tonina
2008 Conference on Precision Electromagnetic Measurements Digest, 396-397, 2008
22008
Real-time quantum-accurate voltage waveform synthesis
J Ireland, S Protheroe, J Williams, A Belcher, R Dekker, K Schaapman, ...
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
12020
A Study of Voltage Dependence of a High DC Voltage Divider
B Miranda, JL Casais, ME Bierzychudek, H Parks, B Djokic
2020 Conference on Precision Electromagnetic Measurements (CPEM), 1-2, 2020
12020
El sistema internacional de unidades y las mediciones eléctricas
ME Bierzychudek, H Laiz
Elektron 3 (2), 91-102, 2019
12019
Operation of a cryogenic current comparator in presence of mechanical vibrations
ME Bierzychudek, M Götz, M Schmelzer
2016 Conference on Precision Electromagnetic Measurements (CPEM 2016), 1-2, 2016
12016
Final report on RMO comparison SIM. EM-S10: High value resistance comparison with two-terminal cryogenic current comparators
ME Bierzychudek, R Elmquist, F Hernández
Metrologia 51 (1A), 01004-01004, 2014
12014
High resistance measurements with a two-terminal cryogenic current comparator
M Bierzychudek, A Tonina
2012 Conference on Precision electromagnetic Measurements, 372-373, 2012
12012
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