| Phosphors for LED-based light sources: Thermal properties and reliability issues M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 52 (9-10), 2164-2167, 2012 | 81 | 2012 |
| Degradation mechanisms of high-power LEDs for lighting applications: An overview M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni IEEE Transactions on Industry Applications 50 (1), 78-85, 2013 | 65 | 2013 |
| Chip and package-related degradation of high power white LEDs M Meneghini, M Dal Lago, N Trivellin, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 52 (5), 804-812, 2012 | 60 | 2012 |
| Thermally activated degradation of remote phosphors for application in LED lighting M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni IEEE Transactions on Device and Materials Reliability 13 (1), 316-318, 2012 | 56 | 2012 |
| Degradation mechanisms of high-power white LEDs activated by current and temperature M Dal Lago, M Meneghini, N Trivellin, G Meneghesso, E Zanoni Microelectronics Reliability 51 (9-11), 1742-1746, 2011 | 33 | 2011 |
| Failure causes and mechanisms of retrofit LED lamps C De Santi, M Dal Lago, M Buffolo, D Monti, M Meneghini, G Meneghesso, ... Microelectronics Reliability 55 (9-10), 1765-1769, 2015 | 28 | 2015 |
| Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting N Trivellin, M Meneghini, M Ferretti, D Barbisan, M Dal Lago, ... 2015 IEEE 1st International Forum on Research and Technologies for Society …, 2015 | 17 | 2015 |
| Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress M Meneghini, M Dal Lago, L Rodighiero, N Trivellin, E Zanoni, ... Microelectronics Reliability 52 (8), 1621-1626, 2012 | 15 | 2012 |
| “Hot-plugging” of LED modules: Electrical characterization and device degradation M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 53 (9-11), 1524-1528, 2013 | 11 | 2013 |
| ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms M Dal Lago, M Meneghini, C De Santi, M Barbato, N Trivellin, ... Microelectronics Reliability 54 (9-10), 2138-2141, 2014 | 8 | 2014 |
| GaN-based LEDs: State of the art and reliability-limiting mechanisms E Zanoni, M Meneghini, N Trivellin, M Dal Lago, G Meneghesso 2014 15th International Conference on Thermal, Mechanical and Mulit-Physics …, 2014 | 7 | 2014 |
| ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements M Meneghini, S Vaccari, M Dal Lago, S Marconi, M Barbato, N Trivellin, ... Microelectronics Reliability 54 (6-7), 1143-1149, 2014 | 6 | 2014 |
| Reliability of high power LEDs: From gradual to catastrophic failure M Meneghini, G Meneghesso, E Zanoni, C DE SANTI, M Buffolo, ... Proceedings of the 5th International LED professional Symposium, LpS 2015 …, 2015 | 2 | 2015 |
| Characterization and endurance study of aluminate/silicate/garnet/nitride phosphors for high-performance SSL N Trivellin, M Meneghini, M Dal Lago, D Barbisan, M Ferretti, ... Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2013 | 1 | 2013 |
| A study on the reverse-bias and ESD instabilities of InGaN-based green LEDs M Meneghini, A Tazzoli, N Trivellin, E Ranzato, M Dal Lago, B Hahn, ... Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2010 | 1 | 2010 |
| Notice of Removal: Analysis of the mechanisms limiting the reliability of retrofit LED lamps C De Santi, M Dal Lago, M Buffolo, M Meneghini, G Meneghesso, ... 2015 IEEE 1st International Forum on Research and Technologies for Society …, 2015 | | 2015 |
| Reliabiltiy of devices and technologies for solid-state lighting M Dal Lago Università degli studi di Padova, 2015 | | 2015 |
| SSL Solutions for Human Centric Lighting N Trivellin, M Meneghini, D Barbisan, M Ferretti, M DAL LAGO, ... Proceedings of the 5th International LED professional Symposium, LpS 2015, 52-62, 2015 | | 2015 |
| High-Temperature Reliability of Retrofit LED Bulbs M Dal Lago, M Buffolo, C De Santi, N Trivellin, M Meneghini, ... Proceedings of the 5th International LED professional Symposium, LpS 2015, 2015 | | 2015 |
| Thermal, optical, and electrical engineering of an innovative tunable white LED light engine N Trivellin, M Meneghini, M Ferretti, D Barbisan, M Dal Lago, ... Light-Emitting Diodes: Materials, Devices, and Applications for Solid State …, 2014 | | 2014 |
