Antonio Rubio
Antonio Rubio
Professor of Electrical Engineering (UPC)
Verified email at upc.edu
TitleCited byYear
Analysis and solutions for switching noise coupling in mixed-signal ICs
X Aragones, JL Gonzalez, A Rubio
Springer Science & Business Media, 2013
1632013
Human powered piezoelectric batteries to supply power to wearable electronic devices
JL González, A Rubio, F Moll
International journal of the Society of Materials Engineering for Resources …, 2002
1532002
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
A Rubio, N Itazaki, X Xu, K Kinoshita
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1411994
Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/testing
VH Champac, A Rubio, J Figueras
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1171994
Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS
R Rodríguez-Montañés, JA Segura, VHC Vilela, J Figueras, JA Rubio
Digest of Papers-International Test Conference, 510-519, 1992
1121992
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
772001
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
742006
Experimental comparison of substrate noise coupling using different wafer types
X Aragones, A Rubio
IEEE Journal of Solid-State Circuits 34 (10), 1405-1409, 1999
671999
Quiescent current sensor circuits in digital VLSI CMOS testing
A Rubio, J Figueras, J Segura
Electronics Letters 26 (15), 1204-1206, 1990
631990
A prospect on the use of piezoelectric effect to supply power to wearable electronic devices
JL Gonzalez, A Rubio, F Moll
Proceedings of the International Conference on Materials Engineering …, 2001
592001
A detailed analysis of GOS defects in MOS transistors: Testing implications at circuit level
J Segura, C De Benito, A Rubio, CF Hawkins
Proceedings of 1995 IEEE International Test Conference (ITC), 544-551, 1995
581995
Fault Modelling of Gate Oxide Short, Floating Gate and Bridging Failuers in CMOS Circuit
VH Champac
Proc. of European Test Conf., 143-148, 1991
531991
Noise generation and coupling mechanisms in deep-submicron ICs
X Aragonès, JL González, F Moll, A Rubio
IEEE Design & Test of Computers 19 (5), 27-35, 2002
522002
An approach to crosstalk effect analysis and avoidance techniques in digital CMOS VLSI circuits
R Anglada, A Rubio
International Journal of Electronics 65 (1), 9-17, 1988
521988
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
512002
Quiescent current analysis and experimentation of defective CMOS circuits
JA Segura, VH Champac, R Rodríguez-Montañés, J Figueras, JA Rubio
Journal of Electronic Testing 3 (4), 337-348, 1992
511992
Substrate coupling evaluation in BiCMOS technology
JM Casalta, X Aragones, A Rubio
IEEE Journal of Solid-State Circuits 32 (4), 598-603, 1997
461997
A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors
J Segura, C De Benito, A Rubio, CF Hawkins
Journal of Electronic Testing 8 (3), 229-239, 1996
451996
Spurious signals in digital CMOS VLSI circuits: a propagation analysis
F Moll, A Rubio
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal …, 1992
451992
Analysis and modelling of parasitic substrate coupling in CMOS circuits
X Aragones, F Moll, M Roca, A Rubio
IEE Proceedings-Circuits, Devices and Systems 142 (5), 307-312, 1995
401995
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