Full-field optical coherence tomography and its application to multiple-layer 2D information retrieving S Chang, X Liu, X Cai, CP Grover Optics Communications 246 (4-6), 579-585, 2005 | 36 | 2005 |
Cemented doublet lens with an extended focal depth X Liu, X Cai, S Chang, CP Grover Optics Express 13 (2), 552-557, 2005 | 29 | 2005 |
Compact system for measurement of optical surfaces having a large radius of curvature X Cai, S Chang, C Flueraru Optical Engineering 45 (7), 073603-073603-6, 2006 | 19 | 2006 |
Image enhancement for multilayer information retrieval by using full-field optical coherence tomography S Chang, X Cai, C Flueraru Applied optics 45 (23), 5967-5975, 2006 | 17 | 2006 |
Bifocal optical system for distant object tracking X Liu, X Cai, S Chang, CP Grover Optics express 13 (1), 136-141, 2005 | 16 | 2005 |
Optical system having a large focal depth for distant object tracking X Liu, X Cai, S Chang, CP Grover Optics Express 11 (24), 3242-3247, 2003 | 10 | 2003 |
Wafer fault measurement by coherent optical processor XY Cai, F Kvasnik, RW Blore Applied optics 33 (20), 4487-4496, 1994 | 10 | 1994 |
Optical tracking system, and optical element therefore with quartic phase plate X Liu, X Cai US Patent App. 10/975,347, 2005 | 7 | 2005 |
Design of zoom lenses used to test optical surfaces having a large radius of curvature X Cai, X Liu, CP Grover Novel Optical Systems Design and Optimization VII 5524, 78-83, 2004 | 5 | 2004 |
Space-variant characteristics in multiple object recognition with a coherent optical processor XY Cai, F Kvasnik Journal of Modern Optics 38 (6), 1145-1158, 1991 | 4 | 1991 |
2D parallel optical coherence tomography and multiple-layer information extraction S Chang, X Cai, E Murdock, C Flueraru Optical Measurement Systems for Industrial Inspection IV 5856, 401-409, 2005 | 3 | 2005 |
Extended depth of field of microscope objective for particle tracking X Liu, X Cai, CP Grover Novel Optical Systems Design and Optimization VII 5524, 436-443, 2004 | 2 | 2004 |
Design of a novel star tracker optical system X Liu, X Cai, C Flueraru, S Chang, CP Grover Spaceborne Sensors 5418, 146-153, 2004 | 2 | 2004 |
Wafer pattern inspection using a coherent optical processor XY Cai, F Kvasnik Machine Vision Applications in Character Recognition and Industrial …, 1992 | 2 | 1992 |
Interference effects and the occurrence of blind spots in coherent optical processors S Christie, XY Cai, F Kvasnik Holographic Optics III: Principles and Applications 1507, 202-209, 1991 | 2 | 1991 |
Resolution Enhancement for Tomographical Images of a Full-Field OCT System S Chang, C Xianyang, F Coste The Open Optics Journal 3 (1), 2009 | 1 | 2009 |
Polarimetry: measurements, error analysis, and application C Flueraru, X Cai, S Chang Nano-and Micro-Metrology 5858, 130-138, 2005 | 1 | 2005 |
Registration error measurements with coherent optical processors XY Cai, F Kvasnik, RW Blore Machine Vision Applications in Industrial Inspection 1907, 258-269, 1993 | 1 | 1993 |
Micro-pattern recognition using a microscope coherent optical processor (M-COP)(IC inspection) XY Cai, S Christie, F Kvasnik 1991 Third International Conference on Holographic Systems, Components and …, 1991 | 1 | 1991 |
Extend focal depth of a tracking lens by phase apodizers X Cai, S Chang, C Flueraru Optical Design and Engineering II 5962, 351-358, 2005 | | 2005 |