P R Mukund
Title
Cited by
Cited by
Year
Self-calibration of input-match in RF front-end circuitry
T Das, A Gopalan, C Washburn, PR Mukund
IEEE Transactions on Circuits and Systems II: Express Briefs 52 (12), 821-825, 2005
1182005
An ultra-fast, on-chip BiST for RF low noise amplifiers
A Gopalan, T Das, C Washburn, PR Mukund
18th International Conference on VLSI Design held jointly with 4th …, 2005
342005
3D heterogeneous sensor system on a chip for defense and security applications
S Bhansali, GH Chapman, EG Friedman, Y Ismail, PR Mukund, D Tebbe, ...
Unattended/Unmanned Ground, Ocean, and Air Sensor Technologies and …, 2004
322004
A current sensor for on-chip, non-intrusive testing of RF systems
A Soldo, A Gopalan, PR Mukund, M Margala
17th International Conference on VLSI Design. Proceedings., 1023-1026, 2004
282004
A current based self-test methodology for RF front-end circuits
A Gopalan, M Margala, PR Mukund
Microelectronics journal 36 (12), 1091-1102, 2005
222005
Designing bulk-driven MOSFETs for ultra-low-voltage analogue applications
C Urban, JE Moon, PR Mukund
Semiconductor science and technology 25 (11), 115011, 2010
202010
Self-calibration of gain and output match in LNAs
T Das, PR Mukund
2006 IEEE International Symposium on Circuits and Systems, 4 pp.-4986, 2006
172006
1/f noise synthesis model in discrete-time for circuit simulation
R Narasimha, SP Bandi, RM Rao, PR Mukund
IEEE Transactions on Circuits and Systems I: Regular Papers 52 (6), 1104-1114, 2005
172005
Maximum intrinsic gain degradation in technology scaling
M Pude, C Macchietto, P Singh, J Burleson, PR Mukund
2007 International Semiconductor Device Research Symposium, 1-2, 2007
152007
A tuned wideband LNA in 0.25/spl mu/m IBM process for RF communication applications
M Benmansour, PR Mukund
17th International Conference on VLSI Design. Proceedings., 631-634, 2004
152004
Guest Editor's Introduction: MCM-The High-Performance Electronic Packaging Technology
PR Mukund
IEEE Computer Architecture Letters 26 (04), 10-12, 1993
151993
Use of source degeneration for non-intrusive BIST of RF front-end circuits
A Gopalan, T Das, C Washbum, PR Mukund
2005 IEEE International Symposium on Circuits and Systems (ISCAS), 4385-4388, 2005
132005
Effects of technology and dimensional scaling on input loss prediction of RF MOSFETs
T Das, C Washburn, PR Mukund, S Howard, K Paradis, JG Jang, J Kolnik, ...
18th International Conference on VLSI Design held jointly with 4th …, 2005
122005
Amplifier gain enhancement with positive feedback
M Pude, PR Mukund, P Singh, K Paradis, J Burleson
2010 53rd IEEE international Midwest symposium on circuits and systems, 981-984, 2010
112010
A non-intrusive self-test methodology for RF CMOS low noise amplifiers
A Gopalan, PR Mukund, M Margala
Proc. IEEE Mixed Signal Test Workshop, 2004
112004
Chip package co-design of a heterogeneously integrated 2.45 GHz CMOS VCO using embedded passives in a silicon package
G Nayak, PR Mukund
17th International Conference on VLSI Design. Proceedings., 627-630, 2004
112004
LNA design optimization with reference to ESD protection circuitry
S Sridharan, G Nayak, PR Mukund
Proceedings of the 2003 International Symposium on Circuits and Systems …, 2003
102003
A novel CMOS monolithic analog multiplier with wide input dynamic range
GA Hadgis, PR Mukund
Proceedings of the 8th International Conference on VLSI Design, 310-314, 1995
101995
High Q embedded inductors in silicon for RF applications
S Sridharan, W Grande, PR Mukund
15th annual IEEE international ASIC/SOC conference, 346-349, 2002
92002
Analog IC design in ultra-thin oxide CMOS technologies with significant direct tunneling-induced gate current
E Bohannon, C Washburn, PR Mukund
IEEE Transactions on Circuits and Systems I: Regular Papers 58 (4), 645-653, 2010
82010
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