| Rotational-state dependent selectivity in the bond fission of C2HD (5ν1) T Arusi-Parpar, RP Schmid, RJ Li, I Bar, S Rosenwaks Chemical physics letters 268 (1-2), 163-168, 1997 | 54 | 1997 |
| Combination bands versus overtone stretch excitation and rotational effects in vibrationally mediated photodissociation of acetylene RP Schmid, Y Ganot, I Bar, S Rosenwaks The Journal of chemical physics 109 (20), 8959-8967, 1998 | 41 | 1998 |
| Photodissociation of rovibrationally excited C2H2: Observation of two pathways RP Schmid, T Arusi-Parpar, RJ Li, I Bar, S Rosenwaks The Journal of chemical physics 107 (2), 385-391, 1997 | 41 | 1997 |
| Infrared spectroscopy of aniline-X (X= N2, CH4, CHF3, CO) clusters and their corresponding cluster cations in the NH2-stretching vibration region RP Schmid, PK Chowdhury, J Miyawaki, F Ito, K Sugawara, T Nakanaga, ... Chemical physics 218 (3), 291-300, 1997 | 39 | 1997 |
| Enhanced action spectra of combination bands of acetylene via vibrationally mediated photodissociation and fragment ionization T Arusi-Parpar, RP Schmid, Y Ganot, I Bar, S Rosenwaks Chemical physics letters 287 (3-4), 347-352, 1998 | 35 | 1998 |
| Designing reflectron time-of-flight mass spectrometers with and without grids: a direct comparison RP Schmid, C Weickhardt International Journal of Mass Spectrometry 206 (3), 181-190, 2001 | 29 | 2001 |
| Rapid dislocation‐related D1‐photoluminescence imaging of multicrystalline Si wafers at room temperature RP Schmid, D Mankovics, T Arguirov, M Ratzke, T Mchedlidze, M Kittler physica status solidi (a) 208 (4), 888-892, 2011 | 27 | 2011 |
| Multiphoton ionization of nitrotoluenes by means of ultrashort laser pulses K Tönnies, RP Schmid, C Weickhardt, J Reif, J Grotemeyer International Journal of Mass Spectrometry 206 (3), 245-250, 2001 | 27 | 2001 |
| Efficient self phase matched third harmonic generation of ultrashort pulses in a material with positive dispersion T Schneider, RP Schmid, J Reif Applied Physics B 72 (5), 563-565, 2001 | 24 | 2001 |
| Optical processing on a femtosecond time scale RP Schmid, T Schneider, J Reif Optics communications 207 (1-6), 155-160, 2002 | 23 | 2002 |
| Femtosecond third-harmonic generation:. self-phase matching through a transient. Kerr grating and the way to ultrafast computing J Reif, RP Schmid, T Schneider Applied Physics B 74, 745-748, 2002 | 15 | 2002 |
| Competition of Thermomyces lanuginosus lipase with its hydrolysis products at the oil–water interface M Muth, S Rothkötter, S Paprosch, RP Schmid, K Schnitzlein Colloids and Surfaces B: Biointerfaces 149, 280-287, 2017 | 13 | 2017 |
| Novel imaging techniques for dislocation‐related D1‐photo‐luminescence of multicrystalline Si wafers–two different approaches RP Schmid, D Mankovics, T Arguirov, T Mchedlidze, M Kittler physica status solidi c 8 (4), 1297-1301, 2011 | 13 | 2011 |
| Dislocation‐related photoluminescence imaging of mc‐Si wafers at room temperature D Mankovics, RP Schmid, T Arguirov, M Kittler Crystal Research and Technology 47 (11), 1148-1152, 2012 | 9 | 2012 |
| Femtosecond all-optical wavelength and time demultiplexer for OTDM/WDM systems RP Schmid, T Schneider, J Reif Applied Physics B 74 (Suppl 1), s205-s208, 2002 | 9 | 2002 |
| Highly Sensitive Infrared Spectroscopy: IR‐REMPI Double Resonance Experiments AH Bahnmaier, R Schmid, B Zhang, H Jones Berichte der Bunsengesellschaft für physikalische Chemie 96 (9), 1305-1308, 1992 | 8 | 1992 |
| Ellipsometric study of molecular orientations of Thermomyces lanuginosus lipase at the air–water interface by simultaneous determination of refractive index and thickness M Muth, RP Schmid, K Schnitzlein Colloids and Surfaces B: Biointerfaces 140, 60-66, 2016 | 7 | 2016 |
| The van der Waals vibrational frequencies of the aniline-carbon monoxide complex in its S1 state JG Jäckel, R Schmid, H Jones, T Nakanaga, H Takeo Chemical physics 215 (2), 291-298, 1997 | 5 | 1997 |
| Action spectra vs rovibrational absorption spectra: a tool for photodissociation dynamics investigation RP Schmid, Y Ganot, S Rosenwaks, I Bar Journal of molecular structure 480, 197-205, 1999 | 4 | 1999 |
| Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress J Reif, R Schmid, T Schneider, D Wolfframm Solid-State Electronics 44 (5), 809-813, 2000 | 3 | 2000 |
