Bo Kyoung Choi

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Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityDirección de correo verificada de vanderbilt.edu
Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityDirección de correo verificada de vanderbilt.edu
Y. M. Wong (Kelvin)Acree Technologies, Inc.Dirección de correo verificada de acreetech.com
Mick HowellResearch & Development Engineer, Vanderbilt UniversityDirección de correo verificada de vanderbilt.edu
William HofmeisterFounder and CTO Ultra Small Fibers, LLCDirección de correo verificada de ultrasmallfibers.com
Enxia ZhangUniversity of Central FloridaDirección de correo verificada de ucf.edu
Philippe Regis-Guy PiotNorthern Illinois University ; Argonne National LaboratoryDirección de correo verificada de fnal.gov
Joyeeta NagIBMDirección de correo verificada de us.ibm.com
John W. LewellenLos Alamos National LaboratoryDirección de correo verificada de lanl.gov
Lloyd MassengillVanderbilt UniversityDirección de correo verificada de vanderbilt.edu
Sharon M. WeissProfessor of Electrical and Computer Engineering, Physics, Vanderbilt UniversityDirección de correo verificada de vanderbilt.edu
Judson D. RyckmanClemson UniversityDirección de correo verificada de clemson.edu
Yevgeniy PuzyrevData & Applied Scientist, MicrosoftDirección de correo verificada de microsoft.com
Leonard BrillsonThe Ohio State UniversityDirección de correo verificada de osu.edu
Tania RoyDuke UniversityDirección de correo verificada de duke.edu
Kannatassen Appavoo (Krishen)Assistant Professor, Department of Physics, UABDirección de correo verificada de uab.edu
Richard ArineroEnseignant-chercheur, Université de MontpellierDirección de correo verificada de um2.fr
Aditya KalavaguntaDraper LaboratoryDirección de correo verificada de draper.com
Kalman VargaVanderbilt UniversityDirección de correo verificada de vanderbilt.edu
James H. DickersonConsumer ReportsDirección de correo verificada de consumer.org

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Bo Kyoung Choi

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Deep Learning Medical Image Analysis Radiation effect Solid state devices


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
The energy dependence of proton-induced degradation in AlGaN/GaN high electron mobility transistors X Hu, BK Choi, HJ Barnaby, DM Fleetwood, RD Schrimpf, S Lee, ... Nuclear Science, IEEE Transactions on 51 (2), 293-297, 2004	148	2004
Photothermal optical modulation of ultra-compact hybrid Si-VO< sub> 2</sub> ring resonators JD Ryckman, V Diez-Blanco, J Nag, RE Marvel, BK Choi, RF Haglund, ... Optics Express 20 (12), 13215-13225, 2012	109	2012
Process dependence of proton-induced degradation in GaN HEMTs T Roy, EX Zhang, YS Puzyrev, DM Fleetwood, RD Schrimpf, BK Choi, ... IEEE Transactions on Nuclear Science 57 (6), 3060-3065, 2010	106	2010
Heavy-ion-induced breakdown in ultra-thin gate oxides and high-k dielectrics LW Massengill, BK Choi, DM Fleetwood, RD Schrimpf, KF Galloway, ... Nuclear Science, IEEE Transactions on 48 (6), 1904-1912, 2001	95	2001
Determination of proximity effect parameters and the shape bias parameter in electron beam lithography E Seo, BK Choi, O Kim Microelectronic Engineering 53 (1-4), 305-308, 2000	70	2000
Total-dose and single-event effects in switching DC/DC power converters PC Adell, RD Schrimpf, BK Choi, WT Holman, JP Attwood, CR Cirba, ... IEEE Transactions on Nuclear Science 49 (6), 3217-3221, 2002	69	2002
Electron-beam deposition of vanadium dioxide thin films RE Marvel, K Appavoo, BK Choi, J Nag, RF Haglund Applied Physics A 111, 975-981, 2013	66	2013
Long-term reliability degradation of ultrathin dielectric films due to heavy-ion irradiation BK Choi, DM Fleetwood, RD Schrimpf, LW Massengill, KF Galloway, ... IEEE Transactions on Nuclear Science 49 (6), 3045-3050, 2002	66	2002
Characterization of 1.8-MeV proton-irradiated AlGaN/GaN field-effect transistor structures by nanoscale depth-resolved luminescence spectroscopy BD White, M Bataiev, LJ Brillson, BK Choi, DM Fleetwood, RD Schrimpf, ... Nuclear Science, IEEE Transactions on 49 (6), 2695-2701, 2002	56	2002
Temperature dependence and irradiation response of 1/f-noise in MOSFETs HD Xiong, DM Fleetwood, BK Choi, AL Sternberg IEEE Transactions on Nuclear Science 49 (6), 2718-2723, 2002	53	2002
Array geometry, size and spacing effects on field emission characteristics of aligned carbon nanotubes YM Wong, WP Kang, JL Davidson, BK Choi, W Hofmeister, JH Huang Diamond and related materials 14 (11), 2078-2083, 2005	51	2005
Enhanced electron field emission from micropatterned pyramidal diamond tips incorporating CH< sub> 4</sub>/H< sub> 2</sub>/N< sub> 2</sub> plasma-deposited nanodiamond K Subramanian, WP Kang, JL Davidson, RS Takalkar, BK Choi, M Howell, ... Diamond and related materials 15 (4), 1126-1131, 2006	50*	2006
Uniformity conditioning of diamond field emitter arrays JD Jarvis, HL Andrews, CA Brau, BK Choi, J Davidson, WP Kang, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009	43	2009
Fin width and bias dependence of the response of triple-gate MOSFETs to total dose irradiation JJ Song, BK Choi, EX Zhang, RD Schrimpf, DM Fleetwood, CH Park, ... IEEE Transactions on Nuclear Science 58 (6), 2871-2875, 2011	42	2011
Field emission triode amplifier utilizing aligned carbon nanotubes YM Wong, WP Kang, JL Davidson, BK Choi, W Hofmeister, JH Huang Diamond and related materials 14 (11), 2069-2073, 2005	42	2005
Nanodiamond planar lateral field emission diode K Subramanian, WP Kang, JL Davidson, WH Hofmeister, BK Choi, ... Diamond and related materials 14 (11), 2099-2104, 2005	42	2005
Operation of an ungated diamond field-emission array cathode in a L-band radiofrequency electron source P Piot, CA Brau, BK Choi, B Blomberg, WE Gabella, B Ivanov, J Jarvis, ... Applied Physics Letters 104 (26), 2014	41	2014
Channeling Radiation as a Source of Hard X-rays with High Spectral Brilliance CA Brau, BK Choi, JD Jarvis, JW Lewellen, P Piot Synchrotron Radiation News 25 (1), 20-24, 2012	37	2012
Electrochemical sensing using nanodiamond microprobe S Basu, WP Kang, JL Davidson, BK Choi, AB Bonds, DE Cliffel Diamond and related materials 15 (2-3), 269-274, 2006	36	2006
Nanodiamond lateral VFEM technology for harsh environments WP Kang, JL Davidson, K Subramanian, BK Choi, KF Galloway Nuclear Science, IEEE Transactions on 54 (4), 1061-1065, 2007	35	2007

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