Leqi Zhang
Leqi Zhang
Verified email at mentor.com
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Improvement of data retention in HfO2 / Hf 1T1R RRAM cell under low operating current
YY Chen, M Komura, R Degraeve, B Govoreanu, L Goux, A Fantini, ...
Electron Devices Meeting (IEDM), 2013 IEEE International, 10.1. 1-10.1. 4, 2013
Vacancy-modulated conductive oxide resistive RAM (VMCO-RRAM): An area-scalable switching current, self-compliant, highly nonlinear and wide on/off-window resistive switching cell
B Govoreanu, A Redolfi, L Zhang, C Adelmann, M Popovici, S Clima, ...
2013 IEEE International Electron Devices Meeting, 10.2. 1-10.2. 4, 2013
Analysis of complementary RRAM switching
DJ Wouters, L Zhang, A Fantini, R Degraeve, L Goux, YY Chen, ...
IEEE electron device letters 33 (8), 1186-1188, 2012
High-performance metal-insulator-metal tunnel diode selectors
B Govoreanu, C Adelmann, A Redolfi, L Zhang, S Clima, M Jurczak
IEEE electron device letters 35 (1), 63-65, 2013
RRAMs based on anionic and cationic switching: a short overview
S Clima, K Sankaran, YY Chen, A Fantini, U Celano, A Belmonte, L Zhang, ...
physica status solidi (RRL)–Rapid Research Letters 8 (6), 501-511, 2014
Ultrathin metal/amorphous-silicon/metal diode for bipolar RRAM selector applications
L Zhang, A Redolfi, C Adelmann, S Clima, IP Radu, YY Chen, DJ Wouters, ...
IEEE Electron Device Letters 35 (2), 199-201, 2013
Analysis of vertical cross-point resistive memory (VRRAM) for 3D RRAM design
L Zhang, S Cosemans, DJ Wouters, B Govoreanu, G Groeseneken, ...
2013 5th IEEE International Memory Workshop, 155-158, 2013
One-selector one-resistor cross-point array with threshold switching selector
L Zhang, S Cosemans, DJ Wouters, G Groeseneken, M Jurczak, ...
IEEE Transactions on Electron Devices 62 (10), 3250-3257, 2015
A-VMCO: A novel forming-free, self-rectifying, analog memory cell with low-current operation, nonfilamentary switching and excellent variability
B Govoreanu, D Crotti, S Subhechha, L Zhang, YY Chen, S Clima, ...
2015 Symposium on VLSI Technology (VLSI Technology), T132-T133, 2015
High-drive current (>1MA/cm2) and highly nonlinear (>103) TiN/amorphous-Silicon/TiN scalable bidirectional selector with excellent reliability and its variability …
L Zhang, B Govoreanu, A Redolfi, D Crotti, H Hody, V Paraschiv, ...
2014 IEEE International Electron Devices Meeting, 6.8. 1-6.8. 4, 2014
High-performance a-IGZO thin film diode as selector for cross-point memory application
A Chasin, L Zhang, A Bhoolokam, M Nag, S Steudel, B Govoreanu, ...
IEEE electron device letters 35 (6), 642-644, 2014
Selector design considerations and requirements for 1 SIR RRAM crossbar array
L Zhang, S Cosemans, DJ Wouters, G Groeseneken, M Jurczak, ...
2014 IEEE 6th International Memory Workshop (IMW), 1-4, 2014
Tailoring switching and endurance / retention reliability characteristics of HfO2 / Hf RRAM with Ti, Al, Si dopants
YY Chen, R Roelofs, A Redolfi, R Degraeve, D Crotti, A Fantini, S Clima, ...
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical …, 2014
Direct Evidence of the Overshoot Suppression in Ta2O5-Based Resistive Switching Memory With an Integrated Access Resistor
YS Fan, L Zhang, D Crotti, T Witters, M Jurczak, B Govoreanu
IEEE Electron Device Letters 36 (10), 1027-1029, 2015
On the optimal ON/OFF resistance ratio for resistive switching element in one-selector one-resistor crosspoint arrays
L Zhang, S Cosemans, DJ Wouters, G Groeseneken, M Jurczak, ...
IEEE Electron Device Letters 36 (6), 570-572, 2015
Selectors for high density crosspoint memory arrays: Design considerations, device implementations and some challenges ahead
B Govoreanu, L Zhang, M Jurczak
2015 International Conference on IC Design & Technology (ICICDT), 1-4, 2015
A compact NBTI model for accurate analog integrated circuit reliability simulation
E Maricau, L Zhang, J Franco, P Roussel, G Groeseneken, G Gielen
2011 Proceedings of the European Solid-State Device Research Conference …, 2011
Study of the selector element for resistive memory
L Zhang
Performance and reliability of Ultra-Thin HfO2-based RRAM (UTO-RRAM)
B Govoreanu, A Ajaykumar, H Lipowicz, YY Chen, JC Liu, R Degraeve, ...
2013 5th IEEE International Memory Workshop, 48-51, 2013
Cell variability impact on the one-selector one-resistor cross-point array performance
L Zhang, S Cosemans, DJ Wouters, G Groeseneken, M Jurczak, ...
IEEE Transactions on Electron Devices 62 (11), 3490-3497, 2015
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