| HETA: Hybrid error-detection technique using assertions JR Azambuja, M Altieri, J Becker, FL Kastensmidt IEEE Transactions on Nuclear Science 60 (4), 2805-2812, 2013 | 49 | 2013 |
| A fault tolerant approach to detect transient faults in microprocessors based on a non-intrusive reconfigurable hardware JR Azambuja, S Pagliarini, M Altieri, FL Kastensmidt, M Hubner, J Becker, ... IEEE Transactions on Nuclear Science 59 (4), 1117-1124, 2012 | 37 | 2012 |
| Digital circuit performance estimation under PVT and aging effects MA Scarpato Université Grenoble Alpes, 2017 | 18 | 2017 |
| Body Bias usage in UTBB FDSOI designs: A parametric exploration approach D Puschini, J Rodas, E Beigne, M Altieri, S Lesecq Solid-State Electronics 117, 138-145, 2016 | 18 | 2016 |
| Evaluating the efficiency of software-only techniques to detect SEU and SET in microprocessors JR Azambuja, F Sousa, L Rosa, FL Kastensmidt arXiv preprint arXiv:2309.16876, 2023 | 17 | 2023 |
| Evaluating the efficiency of data-flow software-based techniques to detect SEEs in microprocessors JR Azambuja, A Lapolli, M Altieri, FL Kastensmidt 2011 12th Latin American Test Workshop (LATW), 1-6, 2011 | 13 | 2011 |
| Coupled voltage and frequency control for dvfs management M Altieri, W Lombardi, D Puschini, S Lesecq 2013 23rd International Workshop on Power and Timing Modeling, Optimization …, 2013 | 9 | 2013 |
| Multivariable voltage and frequency control for DVFS management W Lombardi, M Altieri, Y Akgul, D Puschini, S Lesecq 2014 IEEE Conference on Control Applications (CCA), 2028-2033, 2014 | 7 | 2014 |
| Non intrusive hybrid signature-based technique to detect seu and set faults in microprocessors J Azambuja, M Altieri, F Kastensmidt, M Hübner, J Becker 11th European Conference on Radiation and Its Effects on Components and …, 2010 | 7 | 2010 |
| Towards on-line estimation of BTI/HCI-induced frequency degradation M Altieri, S Lesecq, E Beigne, O Heron 2017 IEEE International Reliability Physics Symposium (IRPS), CR-6.1-CR-6.6, 2017 | 6 | 2017 |
| Advanced 3d Design and Technologies for 3-Layer Smart Imager P Vivet, L Arnaud, S Borel, N Bresson, M Assous, S Nicolas, G Mauguen, ... 2022 International Symposium on VLSI Technology, Systems and Applications …, 2022 | 5 | 2022 |
| On-silicon validation of a benchmark generation methodology for effectively evaluating combinational cell library design M De Carvalho, M Altieri, L Puricelli, P Butzen, RP Ribas, E Fabris 2016 17th Latin-American Test Symposium (LATS), 135-140, 2016 | 4 | 2016 |
| Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor M Altieri, S Lesecq, D Puschini, O Heron, E Beigne, J Rodas 2015 25th International Workshop on Power and Timing Modeling, Optimization …, 2015 | 4 | 2015 |
| Improving error detection capability of a SpaceWire router IP J Tarrillo, M Altieri, FL Kastensmidt 2011 12th European Conference on Radiation and Its Effects on Components and …, 2011 | 3 | 2011 |
| Method and device for estimating circuit aging M Altieri, S Lesecq, E Beign, O Heron March, 2017 | 2 | 2017 |
| Tracking BTI and HCI effects at circuit-level in adaptive systems M Altieri, S Lesecq, E Beigne, O Heron, D Puschini 2016 14th IEEE International New Circuits and Systems Conference (NEWCAS), 1-4, 2016 | 2 | 2016 |
| Using dynamic partial reconfiguration to detect sees in microprocessors through non-intrusive hybrid technique JR Azambuja, S Pagliarini, M Altieri, FL Kastensmidt, M Hübner, J Becker Proceedings of the 24th symposium on Integrated circuits and systems design …, 2011 | 2 | 2011 |
| Energy-efficient control through power mode placement with discrete DVFS and Body Bias Y Akgul, D Puschini, L Vincent, M Altieri, P Benoit 2015 IEEE 13th International New Circuits and Systems Conference (NEWCAS), 1-4, 2015 | 1 | 2015 |
| Early estimation of aging in the design flow of integrated circuits through a programmable hardware module C Sandionigi, M Altieri, O Heron 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017 | | 2017 |
| Non-intrusive reconfigurable HW/SW fault tolerance approach to detect transient faults in microprocessor systems JR Azambuja, S Pagliarini, M Altieri, FL Kastensmidt, M Hübner, J Becker, ... 2011 12th European Conference on Radiation and Its Effects on Components and …, 2011 | | 2011 |
