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Omur E. DAGDEVIREN
Omur E. DAGDEVIREN
École de technologie supérieure, University of Quebec
Dirección de correo verificada de yale.edu - Página principal
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Role of double layers at the interface of FeSe/ superconductors
K Zou, S Mandal, SD Albright, R Peng, Y Pu, D Kumah, C Lau, GH Simon, ...
Physical Review B 93 (18), 180506, 2016
492016
Atomic imprinting into metallic glasses
R Li, Z Chen, A Datye, GH Simon, J Ketkaew, E Kinser, Z Liu, C Zhou, ...
Communications Physics 1 (1), 75, 2018
432018
Growth of two dimensional silica and aluminosilicate bilayers on Pd (111): from incommensurate to commensurate crystalline
JH Jhang, C Zhou, OE Dagdeviren, GS Hutchings, UD Schwarz, ...
Physical Chemistry Chemical Physics 19 (21), 14001-14011, 2017
432017
Surface phase, morphology, and charge distribution transitions on vacuum and ambient annealed (100)
OE Dagdeviren, GH Simon, K Zou, FJ Walker, C Ahn, EI Altman, ...
Physical Review B 93 (19), 195303, 2016
402016
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
MZ Baykara, OE Dagdeviren, TC Schwendemann, H Mönig, EI Altman, ...
Beilstein journal of nanotechnology 3, 637, 2012
342012
Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
OE Dagdeviren, J Götzen, H Hölscher, EI Altman, UD Schwarz
Nanotechnology 27 (6), 065703, 2016
302016
The Effect of Photoinduced Surface Oxygen Vacancies on the Charge Carrier Dynamics in TiO2 Films
OE Dagdeviren, D Glass, R Sapienza, E Cortés, SA Maier, IP Parkin, ...
Nano Letters 21 (19), 8348-8354, 2021
292021
Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements
A Mascaro, Y Miyahara, T Enright, OE Dagdeviren, P Grütter
Beilstein Journal of Nanotechnology 10 (1), 617-633, 2019
252019
Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis
OE Dagdeviren, C Zhou, EI Altman, UD Schwarz
Physical Review Applied 9 (4), 044040, 2018
232018
Atomic-scale homogeneous plastic flow beyond near-theoretical yield stress in a metallic glass
J Yu, A Datye, Z Chen, C Zhou, OE Dagdeviren, J Schroers, UD Schwarz
Communications Materials 2 (1), 22, 2021
142021
Direct imaging, three-dimensional interaction spectroscopy, and friction anisotropy of atomic-scale ripples on MoS2
OE Dagdeviren, O Acikgoz, P Grütter, MZ Baykara
npj 2D Materials and Applications 4 (1), 30, 2020
142020
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
OE Dagdeviren, Y Miyahara, A Mascaro, P Grütter
Review of Scientific Instruments 90 (1), 2019
142019
Exploring load, velocity, and surface disorder dependence of friction with one-dimensional and two-dimensional models
OE Dagdeviren
Nanotechnology 29 (31), 315704, 2018
142018
Revealing surface-state transport in ultrathin topological crystalline insulator SnTe films
K Zou, SD Albright, OE Dagdeviren, MD Morales-Acosta, GH Simon, ...
APL Materials 7 (5), 2019
132019
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
OE Dagdeviren, UD Schwarz
Beilstein journal of nanotechnology 8 (1), 657-666, 2017
132017
Relaxation and crystallization studied by observing the surface morphology evolution of atomically flat Pt57. 5Cu14. 7Ni5. 3P22. 5 upon annealing
Z Chen, A Datye, J Ketkaew, S Sohn, C Zhou, OE Dagdeviren, J Schroers, ...
Scripta Materialia 182, 32-37, 2020
122020
Ergodic and nonergodic dynamics of oxygen vacancy migration at the nanoscale in inorganic perovskites
OE Dagdeviren, A Mascaro, S Yuan, J Shirani, KH Bevan, P Grutter
Nano Letters 20 (10), 7530-7535, 2020
112020
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
OE Dagdeviren, UD Schwarz
Review of Scientific Instruments 90 (3), 2019
112019
Length scale and dimensionality of defects in epitaxial SnTe topological crystalline insulator films
OE Dagdeviren, C Zhou, K Zou, GH Simon, SD Albright, S Mandal, ...
Advanced Materials Interfaces 4 (2), 1601011, 2017
112017
Numerical performance analysis of quartz tuning fork-based force sensors
OE Dagdeviren, UD Schwarz
Measurement Science and Technology 28 (1), 015102, 2016
102016
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20