A compact streak camera for 150 fs time resolved measurement of bright pulses in ultrafast electron diffraction GH Kassier, K Haupt, N Erasmus, EG Rohwer, HM Von Bergmann, ... Review of Scientific Instruments 81 (10), 2010 | 93 | 2010 |
The influence of high energy electron irradiation on the Schottky barrier height and the Richardson constant of Ni/4H-SiC Schottky diodes E Omotoso, WE Meyer, FD Auret, AT Paradzah, M Diale, SMM Coelho, ... Materials Science in Semiconductor Processing 39, 112-118, 2015 | 66 | 2015 |
Long range annealing of defects in germanium by low energy plasma ions JFR Archilla, SMM Coelho, FD Auret, VI Dubinko, V Hizhnyakov Physica D: Nonlinear Phenomena 297, 56-61, 2015 | 56 | 2015 |
Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n-type Ge FD Auret, WE Meyer, S Coelho, M Hayes Applied physics letters 88 (24), 2006 | 48 | 2006 |
Photo-triggered pulsed cavity compressor for bright electron bunches in ultrafast electron diffraction GH Kassier, N Erasmus, K Haupt, I Boshoff, R Siegmund, SMM Coelho, ... Applied Physics B 109, 249-257, 2012 | 43 | 2012 |
Effects of hydrogen, oxygen, and argon annealing on the electrical properties of ZnO and ZnO devices studied by current-voltage, deep level transient spectroscopy, and Laplace DLTS W Mtangi, FD Auret, WE Meyer, MJ Legodi, PJ Janse van Rensburg, ... Journal of Applied Physics 111 (9), 2012 | 39 | 2012 |
Effects of 5.4 MeV alpha-particle irradiation on the electrical properties of nickel Schottky diodes on 4H–SiC E Omotoso, WE Meyer, FD Auret, AT Paradzah, M Diale, SMM Coelho, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2015 | 26 | 2015 |
Electrical characterization of defects introduced during electron beam deposition of W Schottky contacts on n-type 4H-SiC E Omotoso, WE Meyer, SMM Coelho, M Diale, PNM Ngoepe, FD Auret Materials Science in Semiconductor Processing 51, 20-24, 2016 | 20 | 2016 |
A comparative study of the electrical properties of Pd/ZnO Schottky contacts fabricated using electron beam deposition and resistive/thermal evaporation techniques W Mtangi, FD Auret, PJ Janse van Rensburg, SMM Coelho, MJ Legodi, ... Journal of Applied Physics 110 (9), 2011 | 18 | 2011 |
Electrical characterization of defects introduced in n-Ge during electron beam deposition or exposure SMM Coelho, FD Auret, PJ Janse van Rensburg, JM Nel Journal of Applied Physics 114 (17), 2013 | 15 | 2013 |
Effect of thermal treatment on the characteristics of iridium Schottky barrier diodes on n-Ge (1 0 0) A Chawanda, SMM Coelho, FD Auret, W Mtangi, C Nyamhere, JM Nel, ... Journal of alloys and compounds 513, 44-49, 2012 | 14 | 2012 |
Electrical characterization of defects introduced during electron beam deposition of Schottky contacts on n-type Ge FD Auret, WE Meyer, S Coelho, M Hayes, JM Nel Materials science in semiconductor processing 9 (4-5), 576-579, 2006 | 14 | 2006 |
Electronic and annealing properties of the E0. 31 defect introduced during Ar plasma etching of germanium FD Auret, SMM Coelho, G Myburg, PJJ van Rensburg, WE Meyer Physica B: Condensed Matter 404 (22), 4376-4378, 2009 | 13 | 2009 |
Electrical characterization of defects introduced in Ge during electron beam deposition of different metals FD Auret, SMM Coelho, M Hayes, WE Meyer, JM Nel physica status solidi (a) 205 (1), 159-161, 2008 | 13 | 2008 |
Electrical characterization of defects introduced in n‐Si during electron beam deposition of Pt FD Auret, SMM Coelho, JM Nel, WE Meyer physica status solidi (a) 209 (10), 1926-1933, 2012 | 12 | 2012 |
Electrical Characterization of Defects Introduced During Sputter Deposition of Schottky Contacts on n-type Ge FD Auret, S Coelho, WE Meyer, C Nyamhere, M Hayes, JM Nel Journal of electronic materials 36, 1604-1607, 2007 | 12 | 2007 |
Electrical characterization of defects in heavy-ion implanted n-type Ge FD Auret, PJJ van Rensburg, M Hayes, JM Nel, S Coelho, WE Meyer, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007 | 12 | 2007 |
Effect of alpha-particle irradiation on the electrical properties of n-type Ge KT Roro, PJJ van Rensburg, FD Auret, S Coelho Physica B: Condensed Matter 404 (22), 4496-4498, 2009 | 11 | 2009 |
Experimental observation of intrinsic localized modes in germanium JFR Archilla, SMM Coelho, FD Auret, C Nyamhere, VI Dubinko, ... Quodons in Mica: Nonlinear Localized Travelling Excitations in Crystals, 343-362, 2015 | 10 | 2015 |
Defect introduction in Ge during inductively coupled plasma etching and Schottky barrier diode fabrication processes FD Auret, SMM Coelho, G Myburg, PJJ van Rensburg, WE Meyer Thin Solid Films 518 (9), 2485-2488, 2010 | 10 | 2010 |